Research on ground simulation testing technology of low orbit TDICCD camera image quality

Junzhou CHENG; Mingpeng HU; Yulong WANG; Wenbo YANG

doi:10.3969/j.issn.1005-5630.2022.03.003

Optical Instruments, Volume. 44, Issue 3, 14(2022)

Research on ground simulation testing technology of low orbit TDICCD camera image quality

Junzhou CHENG1...2, Mingpeng HU1,*, Yulong WANG1,2, and Wenbo YANG12 |Show fewer author(s)

Author Affiliations

¹Institute of Optics and Electronics Chinese Academy of Sciences, Chengdu 610209, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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References(2)

[5] WONG H S, YAO Y L, SCHLIG E S. TDI charge-coupled devices: Design and applications[J]. IBM Journal of Research and Development, 36, 83-106(1992).

[13] [13] DUBEY N, BANERJEE A. Dynamic MTF improvement scheme its validation f CCD operating in TDI mode f earth imaging applications[C]Proceedings Volume 9881, Earth Observing Missions Senss: Development, Implementation, acterization IV. New Delhi, India: SPIE, 2016.

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Junzhou CHENG, Mingpeng HU, Yulong WANG, Wenbo YANG. Research on ground simulation testing technology of low orbit TDICCD camera image quality[J]. Optical Instruments, 2022, 44(3): 14

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Paper Information

Category: TESTING TECHNOLOGY

Received: Jan. 7, 2022

Accepted: Feb. 28, 2022

Published Online: Jul. 8, 2022

The Author Email: HU Mingpeng (hmp@ioe.ac.cn)

DOI:10.3969/j.issn.1005-5630.2022.03.003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

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