Acta Photonica Sinica, Volume. 41, Issue 9, 1094(2012)
Phase Measuring Profilometry Based on Elliptic Pattern Grating
[2] [2] CHO JUI TAY, MADHURI THAKUR, CHENGGEN QUAN. Grating projection system for surface contour measurement[J]. Applied Optics, 2005, 44(8): 13931400.
[3] [3] YU Ruizhi, CAO Yiping. A three dimensional online inspection method for workpiece by PMP[J]. Acta Photonica Sinica, 2008, 37(6): 11391143.
[4] [4] SONG Zhang, Daniel Van Der Weide, James Oliver. Superfast phaseshifting method for 3D shape measurement[J]. Optics Express, 2010, 18(9): 96849689.
[5] [5] KANG Xin, HE Xiaoyuan. Twostep phaseshifting technique for phase measurement profilometry by grating projection[J]. Acta Optica Sinica, 2003, 23(1): 7579.
[6] [6] XU Jiancheng, XU Qiao, CHAI Liqun, et al. Direct phase extraction from interferograms with random phase shifts[J]. Optics Express, 2010, 18(20): 2062020627.
[7] [7] LIU Dahai, LIN Bin. Fourier transform profilometry using zero frequency elimination based on gray modulation[J]. Acta Photonica Sinica, 2011, 40(11): 16971701.
[8] [8] CHEN Lijuan, XU Lihua. Fourier transform profilometry for surface with specular reflection[J]. Acta Optica Sinica, 2010, 30(5): 1349~1353.
[9] [9] ZHENG Ruihua, WANG Yuxiao, ZHANG Xueru, et al. Contouring of column by phasemeasuring profilometry and four digital images[J]. Optical Engineering, 2006, 45(3): 033606.
[10] [10] DUAN Cunli, CEHN Fang, QI RuiLi, et al. A new moire stripe method of measuring 3D object shapes[J]. Acta Photonica Sinica, 2008, 37(7): 14251428.
[11] [11] QUAN C, FU Y, TAY C J. Determination of surface contour by temporal analysis of shadow moire fringes[J]. Optics Communications, 2004, 230(13): 2333.
[12] [12] SHAO Shuangyun, SU Xianyu, ZHANG Qican, et al. Application of modulation measurement profilometry in complex object shape measurement[J]. Acta Optica Sinica, 2004, 24(12): 16231628.
[13] [13] DOU Yunfu, SU Xianyu, CHEN Yanfei, et al. A flexible fast 3D profilometry based on modulation measurement[J]. Optics and Lasers in Engineering, 2011, 49(3): 376383.
[14] [14] SONG Wanzhong, SU Xianyu, CAO Yiping, et al. A new method of threedimensional coordinates calibration in phase measuring profilometry[J]. Acta Optica Sinica, 2003, 23(3): 272277.
[15] [15] PEIRONG JIA, JONATHAN KOFMAN, CHAD ENGLISH. Multiplestep triangularpattern phase shifting and the influence of number of steps and pitch on measurement accuracy[J]. Applied Optics, 2007, 46(16): 32533262.
Get Citation
Copy Citation Text
BIAN Xintian, JI Baowei, CHENG Ju, ZUO Fen. Phase Measuring Profilometry Based on Elliptic Pattern Grating[J]. Acta Photonica Sinica, 2012, 41(9): 1094
Received: Mar. 5, 2012
Accepted: --
Published Online: Aug. 31, 2012
The Author Email: Xintian BIAN (bianxt@126.com)