Acta Photonica Sinica, Volume. 41, Issue 9, 1094(2012)
Phase Measuring Profilometry Based on Elliptic Pattern Grating
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BIAN Xintian, JI Baowei, CHENG Ju, ZUO Fen. Phase Measuring Profilometry Based on Elliptic Pattern Grating[J]. Acta Photonica Sinica, 2012, 41(9): 1094
Paper Information
Received: Mar. 5, 2012
Accepted: --
Published Online: Aug. 31, 2012
The Author Email: Xintian BIAN (bianxt@126.com)
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