Acta Photonica Sinica, Volume. 41, Issue 9, 1094(2012)
Phase Measuring Profilometry Based on Elliptic Pattern Grating
A new method to measure the three dimensional (3D) shape is proposed. In the measurement, the elliptic fringe pattern was projected to the surface of the object and the 3D shape of the object can be reconstructed by this method based on phase measurement profilometry. Some calculation formulas for phase and height are derived. A result of our method is compared with that of the phase measurement profilometry (PMP), which shows that the measurement accuracy of this method can meet accuracy requirement of the measurement. Moreover, this method owns strong ability of antinoise. With large noise, this method also can reconstruct the 3D shape of object. Computer simulation and preliminary validate the feasibility of this method.
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BIAN Xintian, JI Baowei, CHENG Ju, ZUO Fen. Phase Measuring Profilometry Based on Elliptic Pattern Grating[J]. Acta Photonica Sinica, 2012, 41(9): 1094
Received: Mar. 5, 2012
Accepted: --
Published Online: Aug. 31, 2012
The Author Email: Xintian BIAN (bianxt@126.com)