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Spectroscopy and Spectral Analysis, Volume. 37, Issue 3, 685(2017)

Radiation Temperature Measurement Technology Based on the Basis of Spectral Emissivity Function

ZHU Ze-zhong1...2,*, SHEN Hua1,2, WANG Nian1,2, and ZHU Ri-hong12 |Show fewer author(s)
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    [5] [5] Svet D Y, Sayapina V J, Levchuk V V. High Temp-High Pressures, 1979, 26(11): 117.

    [6] [6] Tarasov M D, Karpenko I I, Sudovtsov V A. Combustion. Explosion and Shock Waves, 2007, 43(4): 465.

    [8] [8] Cashdollar K L, Herzberg M. Optics Engineering, 1982, 21(1): 82.

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    ZHU Ze-zhong, SHEN Hua, WANG Nian, ZHU Ri-hong. Radiation Temperature Measurement Technology Based on the Basis of Spectral Emissivity Function[J]. Spectroscopy and Spectral Analysis, 2017, 37(3): 685

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    Paper Information

    Received: Mar. 11, 2016

    Accepted: --

    Published Online: Jun. 20, 2017

    The Author Email: Ze-zhong ZHU (496706388@qq.com)

    DOI:10.3964/j.issn.1000-0593(2017)03-0685-07

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology