Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Spectroscopy and Spectral Analysis, Volume. 37, Issue 3, 685(2017)

Radiation Temperature Measurement Technology Based on the Basis of Spectral Emissivity Function

ZHU Ze-zhong1,2、*, SHEN Hua1,2, WANG Nian1,2, and ZHU Ri-hong1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (3)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    ZHU Ze-zhong, SHEN Hua, WANG Nian, ZHU Ri-hong. Radiation Temperature Measurement Technology Based on the Basis of Spectral Emissivity Function[J]. Spectroscopy and Spectral Analysis, 2017, 37(3): 685

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Received: Mar. 11, 2016

    Accepted: --

    Published Online: Jun. 20, 2017

    The Author Email: ZHU Ze-zhong (496706388@qq.com)

    DOI:10.3964/j.issn.1000-0593(2017)03-0685-07

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology