Acta Optica Sinica, Volume. 43, Issue 10, 1034001(2023)
X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern
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Hairui Yang, Zhijie Tan, Hong Yu, Xuejuan Pan, Shensheng Han. X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern[J]. Acta Optica Sinica, 2023, 43(10): 1034001
Category: X-Ray Optics
Received: Nov. 9, 2022
Accepted: Jan. 3, 2023
Published Online: Apr. 25, 2023
The Author Email: Yu Hong (yuhong@siom.ac.cn)