Acta Optica Sinica, Volume. 43, Issue 10, 1034001(2023)

X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern

Hairui Yang1,2,3, Zhijie Tan1, Hong Yu1,3、*, Xuejuan Pan1, and Shensheng Han1,3
Author Affiliations
  • 1Key Laboratory for Quantum Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, Zhejiang, China
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    Hairui Yang, Zhijie Tan, Hong Yu, Xuejuan Pan, Shensheng Han. X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern[J]. Acta Optica Sinica, 2023, 43(10): 1034001

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    Paper Information

    Category: X-Ray Optics

    Received: Nov. 9, 2022

    Accepted: Jan. 3, 2023

    Published Online: Apr. 25, 2023

    The Author Email: Yu Hong (yuhong@siom.ac.cn)

    DOI:10.3788/AOS221961

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