Acta Optica Sinica, Volume. 43, Issue 10, 1034001(2023)

X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern

Hairui Yang1,2,3, Zhijie Tan1, Hong Yu1,3、*, Xuejuan Pan1, and Shensheng Han1,3
Author Affiliations
  • 1Key Laboratory for Quantum Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, Zhejiang, China
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    Figures & Tables(8)
    Schematic diagram of intensity fluctuation second-order autocorrection
    Signal processing flow chart using a single speckle pattern
    Test samples and detected speckle fields. (a)(e) 10-hole sample; (b)(f) circuit sample; (c)(g) 10-hole defected sample; (d)(h) circuit defected sample
    Angle matching diagram of the rotation angle of the standard image and the correlation coefficientρ. (a) 10-hole sample; (b) circuit sample
    Defected speckle fields under different signal-to-noise ratios. (a) RSN=5 dB; (b) RSN=10 dB; (c) RSN=15 dB; (d) RSN=20 dB
    the variation of correlation coefficient ρ and detected speckle field's image contrast adjust coefficient γ with different signal-to-noise ratios
    Detail enhancement results. (a) High-pass filtering result; (b) Wiener filtering result; (c) guided filtering result; (d) the cross-section of various filtering results, standard speckle, and test speckle in Fig.3(g), when x=0
    • Table 1. Correlation coefficient ρ of the processed results and the simulated speckle field

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      Table 1. Correlation coefficient ρ of the processed results and the simulated speckle field

      Detail enhancement

      measure

      Standard 10-hole sampleDefected 10-hole sampleStandard circuit sampleDefected circuit sample
      Correlation coefficient ρ /arb. units
      Unprocessed0.930.880.92.84
      High-pass filtering0.700.640.780.71
      Wiener filtering0.950.900.950.88
      Guided image filtering0.960.910.970.90
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    Hairui Yang, Zhijie Tan, Hong Yu, Xuejuan Pan, Shensheng Han. X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern[J]. Acta Optica Sinica, 2023, 43(10): 1034001

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    Paper Information

    Category: X-Ray Optics

    Received: Nov. 9, 2022

    Accepted: Jan. 3, 2023

    Published Online: Apr. 25, 2023

    The Author Email: Yu Hong (yuhong@siom.ac.cn)

    DOI:10.3788/AOS221961

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