Journal of Terahertz Science and Electronic Information Technology , Volume. 18, Issue 5, 951(2020)
Nondestructive testing of MCS dielectric defect based on A-Scan and C-Scan of Ultrasonic Test
References(4)
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HE Zhigang, LIANG Dongcheng, GONG Guohu, WANG Xiaomin. Nondestructive testing of MCS dielectric defect based on A-Scan and C-Scan of Ultrasonic Test[J]. Journal of Terahertz Science and Electronic Information Technology , 2020, 18(5): 951
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Received: Feb. 23, 2019
Accepted: --
Published Online: Jan. 22, 2021
The Author Email: Xiaomin WANG (wangxm005@sina.com)
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