Journal of Terahertz Science and Electronic Information Technology , Volume. 18, Issue 5, 951(2020)

Nondestructive testing of MCS dielectric defect based on A-Scan and C-Scan of Ultrasonic Test

HE Zhigang... LIANG Dongcheng, GONG Guohu and WANG Xiaomin* |Show fewer author(s)
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    HE Zhigang, LIANG Dongcheng, GONG Guohu, WANG Xiaomin. Nondestructive testing of MCS dielectric defect based on A-Scan and C-Scan of Ultrasonic Test[J]. Journal of Terahertz Science and Electronic Information Technology , 2020, 18(5): 951

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    Received: Feb. 23, 2019

    Accepted: --

    Published Online: Jan. 22, 2021

    The Author Email: Xiaomin WANG (wangxm005@sina.com)

    DOI:10.11805/tkyda2019052

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