Semiconductor Optoelectronics, Volume. 45, Issue 6, 990(2024)
Deep Learning-Based Apparent Defect Detection in Bridges
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HOU Zhouyang, YANG Liqiong, ZHANG Guiying, XIAO Yufeng. Deep Learning-Based Apparent Defect Detection in Bridges[J]. Semiconductor Optoelectronics, 2024, 45(6): 990
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Received: Jun. 3, 2024
Accepted: Feb. 28, 2025
Published Online: Feb. 28, 2025
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