Researching | Study of the influence of virtual guard ring width on the performance of SPAD detectors in 180 nm standard CMOS technology

Journal of Semiconductors, Volume. 44, Issue 11, 114102(2023)

Study of the influence of virtual guard ring width on the performance of SPAD detectors in 180 nm standard CMOS technology

Danlu Liu¹, Ming Li¹, Tang Xu¹, Jie Dong¹, Yuming Fang^1,2, and Yue Xu^1,2、*

Author Affiliations

¹College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China

²National and Local Joint Engineering Laboratory of RF Integration & Micro-Assembly Technology, Nanjing 210023, China

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Danlu Liu, Ming Li, Tang Xu, Jie Dong, Yuming Fang, Yue Xu. Study of the influence of virtual guard ring width on the performance of SPAD detectors in 180 nm standard CMOS technology[J]. Journal of Semiconductors, 2023, 44(11): 114102

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Paper Information

Category: Articles

Received: Mar. 31, 2022

Accepted: --

Published Online: Jan. 3, 2024

The Author Email: Xu Yue (YXu)

DOI:10.1088/1674-4926/44/11/114102

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