Journal of Semiconductors, Volume. 45, Issue 4, 042701(2024)
Hybrid bonding of GaAs and Si wafers at low temperature by Ar plasma activation
[19] G R He, G H Yang, W H Zheng et al. Analysis of Si/GaAs Bonding Stresses with the Finite Element Method. J Semicond, 27, 11(2006).
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Rui Huang, Zhiyong Wang, Kai Wu, Hao Xu, Qing Wang, Yecai Guo. Hybrid bonding of GaAs and Si wafers at low temperature by Ar plasma activation[J]. Journal of Semiconductors, 2024, 45(4): 042701
Category: Articles
Received: Sep. 29, 2023
Accepted: --
Published Online: Jun. 21, 2024
The Author Email: Huang Rui (RHuang)