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Spectroscopy and Spectral Analysis, Volume. 29, Issue 1, 268(2009)

XPS and Raman Spectral Analysis of Nitrogenated Tetrahedral Amorphous Carbon (ta-C:N) Films with Different Nitrogen Content

CHEN Wang-shou*... ZHU Jia-qi, HAN Jie-cai, TIAN Gui and TAN Man-lin |Show fewer author(s)
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    CHEN Wang-shou, ZHU Jia-qi, HAN Jie-cai, TIAN Gui, TAN Man-lin. XPS and Raman Spectral Analysis of Nitrogenated Tetrahedral Amorphous Carbon (ta-C:N) Films with Different Nitrogen Content[J]. Spectroscopy and Spectral Analysis, 2009, 29(1): 268

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    Paper Information

    Received: Oct. 26, 2007

    Accepted: --

    Published Online: Dec. 9, 2009

    The Author Email: Wang-shou CHEN (chenwangshou123@163.com)

    DOI:10.3964/j.issn.1000-0593(2009)01-0268-05

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology