Laser & Optoelectronics Progress, Volume. 56, Issue 22, 221202(2019)
Three-Dimensional Measurement of Highly-Reflective Surface Using Structured Light Technique
[3] Gupta M, Agrawal A, Veeraraghavan A et al. Structured light 3D scanning in the presence of global illumination. [C]∥CVPR 2011, June 20-25,2011, Colorado Springs, CO, USA. New York: IEEE, 713-720(2011).
[4] Gupta M, Nayar S K. Micro phase shifting. [C]∥2012 IEEE Conference on Computer Vision and Pattern Recognition, June 16-21, 2012, Providence, RI, USA. New York: IEEE, 813-819(2012).
[11] Rao L, Da F P. High dynamic range 3D shape determination based on automatic exposure selection[J]. Journal of Visual Communication and Image Representation, 50, 217-226(2018).
[15] Waddington C, Kofman J. Saturation avoidance by adaptive fringe projection in phase-shifting 3D surface-shape measurement. [C]∥2010 International Symposium on Optomechatronic Technologies, October 25-27, 2010, Toronto, ON, Canada. New York: IEEE, 11747004(2010).
[24] Jeong J, Hong D, Cho H. Measurement of partially specular objects by controlling imaging range[J]. Proceedings of SPIE, 6718, 671808(2007).
[25] Jeong J, Kim M Y. Adaptive imaging system with spatial light modulator for robust shape measurement of partially specular objects[J]. Optics Express, 18, 27787-27801(2010).
[26] Nayar S K, Mitsunaga T. High dynamic range imaging: spatially varying pixel exposures. [C]∥Proceedings IEEE Conference on Computer Vision and Pattern Recognition. CVPR 2000 (Cat. No.PR00662), June 15-15, 2000,Hilton Head Island, SC, USA. New York: IEEE, 6651672(2000).
[28] Nayar S K, Gupta M. Diffuse structured light. [C]∥2012 IEEE International Conference on Computational Photography (ICCP), April 28-29, 2012, Seattle,WA, USA. New York: IEEE, 12804039(2012).
[29] Debevec P E, Malik J. Recovering high dynamic range radiance maps from photographs. [C]∥Proceedings of the 24th annual conference on Computer graphics and interactive techniques-SIGGRAPH '97, August 3-8, 1997. New York: Association for Computing Machinery(1997).
[30] Ziou D, Tabbone S. Edge detection techniques-an overview[J]. Pattern Recognition and Image Analysis C/C of Raspoznavaniye Obrazov I Analiz Izobrazhenii, 8, 537-559(1998).
[32] Zhang X, Zhu L M, Chu L W. Evaluation of coded structured light methods using ground truth. [C]∥2011 IEEE 5th International Conference on Cybernetics and Intelligent Systems (CIS), September 17-19, 2011, Qingdao, China. New York: IEEE, 117-123(2011).
Get Citation
Copy Citation Text
Jianyang Feng, Haiyun Chen, Chu Shi, Gaoming Liu, Xiang Yan. Three-Dimensional Measurement of Highly-Reflective Surface Using Structured Light Technique[J]. Laser & Optoelectronics Progress, 2019, 56(22): 221202
Category: Instrumentation, Measurement and Metrology
Received: May. 8, 2019
Accepted: May. 17, 2019
Published Online: Nov. 2, 2019
The Author Email: Chen Haiyun (547549315@qq.com)