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Laser & Optoelectronics Progress, Volume. 56, Issue 22, 221202(2019)

Three-Dimensional Measurement of Highly-Reflective Surface Using Structured Light Technique

Jianyang Feng, Haiyun Chen*, Chu Shi, Gaoming Liu, and Xiang Yan
Author Affiliations
  • School of Electrical Engineering and Information, Southwest Petroleum University, Chengdu, Sichuan 610500, China
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    Article index updated:May. 20, 2024

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    Jianyang Feng, Haiyun Chen, Chu Shi, Gaoming Liu, Xiang Yan. Three-Dimensional Measurement of Highly-Reflective Surface Using Structured Light Technique[J]. Laser & Optoelectronics Progress, 2019, 56(22): 221202

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: May. 8, 2019

    Accepted: May. 17, 2019

    Published Online: Nov. 2, 2019

    The Author Email: Chen Haiyun (547549315@qq.com)

    DOI:10.3788/LOP56.221202

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology