Acta Physica Sinica, Volume. 69, Issue 17, 177103-1(2020)
[2] Sarkar T, Sapp S, Challa A[J]. 28th Annual IEEE Applied Power Electronics Conference and Exposition APEC, 507(2013).
[3] Park C, Havanur S, Shibib A, Terrill K[J]. 28th International Symposium on Power Semiconductor Devices and ICs ISPSD, 387(2016).
[4] Tong C F, Cortes I, Mawby P A, Covington J A, Morancho F[J]. IEEE Spanish Conference on Electron Devices Santiago de Compostela, 250(2009).
[5] Choi W, Son D, Young S[J]. 27th Annual IEEE Applied Power Electronics Conference and Exposition APEC, 1676(2012).
[7] Bao J, Qi H, Zhang J, Zhang Y, Hao Z[J]. 6th IEEE Joint International Information Technology and Artificial Intelligence Conference, 245(2011).
[10] Tanaka A, Oritsuki Y, Kikuchihara H, Miyake M[J]. IEEE Trans. Electron Devices, 58, 2072(2011).
[11] Victory J, Pearson S, Benczkowski S, Sarkar T, Jang H, Yazdi M B, Mao K[J]. 28th International Symposium on Power Semiconductor Devices and ICs, 219(2016).
[12] Xiao Y, Victory J, Pearson S, Sarkar T, Challa A, Dagan M, Collanton P, Andreev C[J]. 34th Annual IEEE Applied Power Electronics Conference and Exposition, 508(2019).
[14] , Lu J, Song L M[J]. Fundamentals of Power Semiconductor Devices, 197-198(2013).
[18] Ren M, Chen Z, Niu B, Cao X, Li S, Li Z, Zhang B[J]. IEEE International Nanoelectronics Conference INEC, 1(2016).
[19] Chauhan Y S, Gillon R, Declercq M, Ionescu A M[J]. 37th European Solid State Device Research Conference, 426(2007).
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Yi-Xun Jiang, Ming Qiao, Wen-Ming Gao, Xiao-Dong He, Jun-Bo Feng, Sen Zhang, Bo Zhang.
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Received: Mar. 11, 2020
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Published Online: Jan. 4, 2021
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