Journal of Applied Optics, Volume. 45, Issue 5, 1072(2024)

Experimental study on back-illuminated CMOS image sensor irradiated by CW laser

Yongbo XU1...2, Yunzhe WANG1,2, Changbin ZHENG1, Yang LIU1, Xiangzheng CHENG3 and Junfeng SHAO1,* |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Laser Interaction with Matter, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Key Laboratory of Electro-Optic Countermeasures Test & Evaluation Technology, Luoyang Electronic Equipment Test Center of China, Luoyang 471003, China
  • show less
    References(19)

    [1] Ming SHAO, Leilei ZHANG, Wei ZHAO et al. Experiment study on saturation effect of high-repetition-rate laser jamming CMOS camera. Laser Journal, 34, 16-17(2013).

    [2] Liang SHENG, Zhen ZHANG, Jianmin ZHANG et al. Experimental study on a visible light CMOS camera irradiated by 632.8 nm CW laser. Modern Applied Physics, 6, 181-185(2015).

    [3] Jingnan WANG, Jinsong NIE. Experimental study on supercontinuum laser irradiating a visible light CMOS imaging sensor. Infrared and Laser Engineering, 46, 0106004(2017).

    [4] Ming SHAO, Le ZHANG, Leilei ZHANG et al. Comparative study on saturation effect of 1.06 μm laser jamming CCD and CMOS cameras. Journal of Applied Optics, 35, 163-167(2014).

    [5] Liang SHENG, Zhen ZHANG, Jianmin ZHANG et al. Pixel upset effect and mechanism of CW laser irradiated CMOS camera. Infrared and Laser Engineering, 45, 0606004(2016).

    [6] Xuanfeng ZHOU, Qianrong CHEN, Yanbin WANG et al. Image interrupt effect and mechanism of pulse laser irradiated CMOS camera. Infrared and Laser Engineering, 48, 0306002(2019).

    [7] Junyang LIN, Rong SHU, Genghua HUANG et al. Study on threshold of laser damage to ccd and cmos image sensors. Journal of Infrared and Millimeter Waves, 27, 475-478(2008).

    [8] Feng GUO. Comparative study on irradiation effect of laser on CMOS and CCD(2013).

    [9] Ang WANG, Feng GUO, Zhiwu ZHU et al. Comparative study of hard CMOS damage irradiated by CW laser and single-pulse ns laser. High Power Laser and Particle Beams, 26, 091007(2014).

    [10] Honggang XIANG. Study on some problems of strong light irradiation effect of CMOS area array detector(2020).

    [11] Peng LEI, Ke SUN, Hua LI et al. Experimental study on the change of cat eye echo pattern with laser damage of CMOS detector. Chinese Journal of Lasers, 43, 0601001(2016).

    [12] Xue WANG. Research on laser blinding and damage technology of photoelectric sensors(2018).

    [13] Mengzhen ZHU, Yun LIU, Chaowei MI et al. Experimental study on a CMOS image sensor damaged by a composite laser. Infrared and Laser Engineering, 51, 227-233.(2022).

    [14] Jiaqi WEN, Jintian BIAN, Xin LI et al. Research progress of laser dazzle and damage CMOS image sensor. Infrared and Laser Engineering, 52, 379-393.(2023).

    [15] F BARTOLI, L ESTEROWITZ, M KRUER et al. Irreversible laser damage in ir detector materials. Applied Optics, 16, 2934-2937(1977).

    [16] F BARTOLI, L ESTEROWITZ, R ALLEN et al. A generalized thermal model for laser damage in infrared detectors. Journal of Applied Physics, 47, 2875-2881(1976).

    [17] F BARTOLI, M KRUER, L ESTEROWITZ et al. Laser damage in triglycine sulfate: experimental results and thermal analysis. Journal of Applied Physics, 44, 3713-3720(1973).

    [18] Junfeng SHAO. Damage effect and mechanism of short pulse laser on silicon and silicon-based optoelectronic devices(2015).

    [19] Ang WANG. Study on laser irradiation effect of visible CMOS image sensor(2014).

    Tools

    Get Citation

    Copy Citation Text

    Yongbo XU, Yunzhe WANG, Changbin ZHENG, Yang LIU, Xiangzheng CHENG, Junfeng SHAO. Experimental study on back-illuminated CMOS image sensor irradiated by CW laser[J]. Journal of Applied Optics, 2024, 45(5): 1072

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Sep. 20, 2023

    Accepted: --

    Published Online: Dec. 20, 2024

    The Author Email: SHAO Junfeng (邵俊峰)

    DOI:10.5768/JAO202445.0507003

    Topics