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Chinese Optics Letters, Volume. 8, Issue 4, 361(2010)

Influence of annealing temperature on the performance of Ge film and photon-counting imaging system

Feifei Zhao1,2, Baosheng Zhao1, Xiaofeng Sai1, Xinghua Zhang1,2, Yonglin Wei1, and Wei Zou1
Author Affiliations
  • 1State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049, China
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    Cited By

    [1] Li Te Tsou, Sheng Hao Chen, Huai Yi Chen, Yao Jen Lee, Horng Show Koo, Chiung Hui Lai. Characterization of Rapid Thermal and Micro-Wave Annealed Germanium Thin Films Grown by E-Beam Evaporation on Glass Substrates. Advanced Materials Research, 663, 431(2013).

    [2] Yunpeng Li, Bo Chen, Xuejing Dai, Hongchen Yang, Huapeng Wang, Huabin Yang, Xiaoduo Wang, Xiaodong Wang, Yang Liu. Temperature environmental adaptability on electrical and stress properties of Ge film in space. Journal of Materials Research and Technology, 15, 6670(2021).

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    Feifei Zhao, Baosheng Zhao, Xiaofeng Sai, Xinghua Zhang, Yonglin Wei, Wei Zou, "Influence of annealing temperature on the performance of Ge film and photon-counting imaging system," Chin.Opt.Lett. 8, 361 (2010)

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    Paper Information

    Received: Jul. 22, 2009

    Accepted: --

    Published Online: Apr. 20, 2010

    The Author Email:

    DOI:10.3788/COL20100804.0361

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology