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Chinese Optics Letters, Volume. 8, Issue 4, 361(2010)

Influence of annealing temperature on the performance of Ge film and photon-counting imaging system

Feifei Zhao1,2, Baosheng Zhao1, Xiaofeng Sai1, Xinghua Zhang1,2, Yonglin Wei1, and Wei Zou1
Author Affiliations
  • 1State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049, China
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    Feifei Zhao, Baosheng Zhao, Xiaofeng Sai, Xinghua Zhang, Yonglin Wei, Wei Zou. Influence of annealing temperature on the performance of Ge film and photon-counting imaging system[J]. Chinese Optics Letters, 2010, 8(4): 361

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    Paper Information

    Received: Jul. 22, 2009

    Accepted: --

    Published Online: Apr. 20, 2010

    The Author Email:

    DOI:10.3788/COL20100804.0361

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology