Laser & Optoelectronics Progress, Volume. 53, Issue 9, 93001(2016)
Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy
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Wang Qin, Zhao Chang, Yang Huinan, Su Mingxu, Cai Xiaoshu. Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(9): 93001
Category: Spectroscopy
Received: Apr. 11, 2016
Accepted: --
Published Online: Sep. 14, 2016
The Author Email: Qin Wang (usst_wangqin@163.com)