Laser & Optoelectronics Progress, Volume. 53, Issue 9, 93001(2016)
Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy
Article index updated:May. 21, 2024
Get Citation
Copy Citation Text
Wang Qin, Zhao Chang, Yang Huinan, Su Mingxu, Cai Xiaoshu. Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(9): 93001
Category: Spectroscopy
Received: Apr. 11, 2016
Accepted: --
Published Online: Sep. 14, 2016
The Author Email: Qin Wang (usst_wangqin@163.com)