Journal of Terahertz Science and Electronic Information Technology , Volume. 22, Issue 5, 537(2024)
Failure rate prediction for feedback terminal units based on the improved stacked denoising autoencoder
References(2)
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ZHAO Jianjun, LIU Jialin, LI Yang, WANG Hengyu, YANG Ting. Failure rate prediction for feedback terminal units based on the improved stacked denoising autoencoder[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(5): 537
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Received: Jun. 7, 2022
Accepted: --
Published Online: Aug. 22, 2024
The Author Email: Jianjun ZHAO (1015367472@qq.com.)
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