Journal of Terahertz Science and Electronic Information Technology , Volume. 22, Issue 5, 537(2024)

Failure rate prediction for feedback terminal units based on the improved stacked denoising autoencoder

ZHAO Jianjun1,*... LIU Jialin1, LI Yang1, WANG Hengyu2 and YANG Ting3 |Show fewer author(s)
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    ZHAO Jianjun, LIU Jialin, LI Yang, WANG Hengyu, YANG Ting. Failure rate prediction for feedback terminal units based on the improved stacked denoising autoencoder[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(5): 537

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    Received: Jun. 7, 2022

    Accepted: --

    Published Online: Aug. 22, 2024

    The Author Email: Jianjun ZHAO (1015367472@qq.com.)

    DOI:10.11805/tkyda2022124

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