Optics and Precision Engineering, Volume. 18, Issue 10, 2178(2010)

Dynamic testing of MEMS micro-structure and its measurement system at low temperatures

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Dynamic testing of MEMS micro-structure and its measurement system at low temperatures[J]. Optics and Precision Engineering, 2010, 18(10): 2178

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    Paper Information

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    Received: Dec. 8, 2009

    Accepted: --

    Published Online: Feb. 15, 2011

    The Author Email: (dutsds@gmail.com)

    DOI:

    CSTR:32186.14.

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