Chinese Optics Letters, Volume. 13, Issue 12, 121201(2015)
Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO4 laser
Fig. 1. Configuration and physical principles of the system. (a) The system schematic. (b) The normalized defocusing curve with a certain objective. (c) The calibrated linear range.
Fig. 2.
Fig. 3. Normalized linear ranges with different objective lenses. (a) Linear range with the objective of
Fig. 4. Measured results of the silicon grating profile. (a) Grating profile measured by AFM. (b) Grating profile measured by our system.
Fig. 5. Physical maps of the micro-gyroscope and the rotor. (a) The micro-gyroscope to be measured. (b) Upper: the rotor corroded from the micro-gyroscope; lower: the top view of the rotor.
Fig. 6. Cross section of the rotor along the scanning direction in Fig.
Fig. 7. Measurement results. Left: Lateral scanning diagram of the rotor; right: the edge slope of the rotor.
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Weiping Wang, Yidong Tan, Shulian Zhang, Yan Li. Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO4 laser[J]. Chinese Optics Letters, 2015, 13(12): 121201
Category: Instrumentation, measurement, and metrology
Received: Aug. 11, 2015
Accepted: Oct. 27, 2015
Published Online: Sep. 12, 2018
The Author Email: Shulian Zhang (zsl@mails.tsinghua.edu.cn)