Optoelectronics Letters, Volume. 18, Issue 8, 489(2022)
Measurement of thin liquid film thickness in pipes based on optical interferometry
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XUE Ting, WU Yan. Measurement of thin liquid film thickness in pipes based on optical interferometry[J]. Optoelectronics Letters, 2022, 18(8): 489
Received: Feb. 11, 2022
Accepted: Apr. 7, 2022
Published Online: Jan. 20, 2023
The Author Email: Ting XUE (xueting@tju.edu.cn)