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Optoelectronics Letters, Volume. 18, Issue 8, 489(2022)

Measurement of thin liquid film thickness in pipes based on optical interferometry

Ting XUE* and Yan WU
Author Affiliations
  • School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
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    XUE Ting, WU Yan. Measurement of thin liquid film thickness in pipes based on optical interferometry[J]. Optoelectronics Letters, 2022, 18(8): 489

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    Paper Information

    Received: Feb. 11, 2022

    Accepted: Apr. 7, 2022

    Published Online: Jan. 20, 2023

    The Author Email: Ting XUE (xueting@tju.edu.cn)

    DOI:10.1007/s11801-022-2022-9

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology