Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1924002(2021)

Three-Wavelength High-Reflectivity Film for All-Solid-State 355-nm Ultraviolet Laser

Qiuhui Zhuang1、* and Sanqiang Wang2
Author Affiliations
  • 1College of Mechanical Engineering, Chongqing University of Technology, Chongqing 400050, China
  • 2State Grid Chongqing Electric Power Company Marketing Service Center, Chongqing 400020, China
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    References(9)

    [3] Yuan J M, Tang Z S, Qi H J et al. Optical constants and properties of several kinds of ultraviolet thin film materials[J]. Acta Optica Sinica, 23, 984-988(2003).

    [5] Li T T, Zhang M J, Tian K Z et al. Femtosecond laser-induced damage on Ge-Sb-S chalcogenide glass[J]. Acta Optica Sinica, 39, 1016001(2019).

    [6] Zong H W, Zhao J S, Song X L et al. Development of research on damage characteristics of calcium fluoride crystal under deep ultraviolet laser irradiation[J]. Laser & Optoelectronics Progress, 56, 190002(2019).

    [7] Mu W, Shen W D, Yang C Y et al. Preparation of anti-reflection coatings on quartz tube surfaces based on atomic layer deposition[J]. Acta Optica Sinica, 39, 0324001(2019).

    [8] Wang Y, Hang L X. Study on the relationship between gradient of antireflection film and laser damage threshold[J]. Applied optics, 40, 151-157(2019).

    [9] Yi P. Preparation and properties of laser damage resistant films[D](2015).

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    Qiuhui Zhuang, Sanqiang Wang. Three-Wavelength High-Reflectivity Film for All-Solid-State 355-nm Ultraviolet Laser[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1924002

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    Paper Information

    Category: Optics at Surfaces

    Received: Dec. 31, 2020

    Accepted: Mar. 2, 2021

    Published Online: Oct. 14, 2021

    The Author Email: Zhuang Qiuhui (zqh@cqut.edu.cn)

    DOI:10.3788/LOP202158.1924002

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