Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1924002(2021)
Three-Wavelength High-Reflectivity Film for All-Solid-State 355-nm Ultraviolet Laser
Fig. 1. Spectral curve of membrane system
Fig. 2. Test spectral curve of thin film
Fig. 3. Laser damage threshold of different substrate materials and cleaning process
Fig. 4. Damage morphology under different working vacuum. (a) 7×10-3 Pa; (b) 9×10-3 Pa; (c) 2×10-2 Pa; (d) 3×10-2 Pa
Fig. 5. Weak absorption values of film samples under different working vacuum
Fig. 6. Laser damage threshold of thin film samples under different working vacuum
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Qiuhui Zhuang, Sanqiang Wang. Three-Wavelength High-Reflectivity Film for All-Solid-State 355-nm Ultraviolet Laser[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1924002
Category: Optics at Surfaces
Received: Dec. 31, 2020
Accepted: Mar. 2, 2021
Published Online: Oct. 14, 2021
The Author Email: Zhuang Qiuhui (zqh@cqut.edu.cn)