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Microelectronics, Volume. 53, Issue 1, 139(2023)

Simulation Research on Performance Degradation of Ultra-Thin Flexible Silicon CMOS Devices and Passive Components

YANG Hong1...2, ZHANG Zhengyuan2, CHEN Xian2, YI Xiaohui2 and CHEN Wensuo3 |Show fewer author(s)
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  • 1[in Chinese]
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    YANG Hong, ZHANG Zhengyuan, CHEN Xian, YI Xiaohui, CHEN Wensuo. Simulation Research on Performance Degradation of Ultra-Thin Flexible Silicon CMOS Devices and Passive Components[J]. Microelectronics, 2023, 53(1): 139

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    Received: Feb. 14, 2022

    Accepted: --

    Published Online: Dec. 15, 2023

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.220049

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology