Chinese Journal of Quantum Electronics, Volume. 22, Issue 3, 344(2005)
Existence of the best resolution of near-field optical microscope for dielectric spherical nanometric particles
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Existence of the best resolution of near-field optical microscope for dielectric spherical nanometric particles[J]. Chinese Journal of Quantum Electronics, 2005, 22(3): 344
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