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Chinese Journal of Quantum Electronics, Volume. 22, Issue 3, 344(2005)

Existence of the best resolution of near-field optical microscope for dielectric spherical nanometric particles

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Existence of the best resolution of near-field optical microscope for dielectric spherical nanometric particles[J]. Chinese Journal of Quantum Electronics, 2005, 22(3): 344

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    Received: Apr. 29, 2004

    Accepted: --

    Published Online: May. 15, 2006

    The Author Email: (mengqian_0920@tom.com)

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology