Microelectronics, Volume. 54, Issue 2, 287(2024)
Improved SiC LBJT Behavior Model Considering Recombination Current
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PAN Can, MOU Bingfu, LI Jun, Wang Yinxin, GUO Linlin. Improved SiC LBJT Behavior Model Considering Recombination Current[J]. Microelectronics, 2024, 54(2): 287
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Received: Sep. 18, 2023
Accepted: --
Published Online: Aug. 21, 2024
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