Optics and Precision Engineering, Volume. 17, Issue 3, 583(2009)

PZT piezoelectric function structure on silicon substrate

WANG Wei1,*... TIAN Li1, LIU Xiao-wei1, REN Ming-yuan2 and ZHANG Ying1 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less

    In order to obtain a PZT piezoelectric function structure on the silicon substrate suitable for monolithic integrated chip, the research status quo of PZT piezoelectric thin (thick) films in the field of MEMS is analyzed, and then a new type of bi-cup PZT/Si film function structure is presented. This structure is optimized and designed with ANSYS finite element analysis software. The optimized structure parameters of the PZT and up-/sub-silicon-cup are DPZT∶D1∶D2=0.75∶1.1∶1;and the resonant frequency of the first-order modality is 13.2 kHz. The bi-cup PZT piezoelectric thick film on the silicon substrate is fabricated with the oxidation, lithography, anisotropism etching and screen-printing processing, whose thickness is 80 μm, and has piezoelectric driving function. This PZT piezoelectric thick film driving structure with bi-cup on the silicone substrate has a better compatibility with MEMS technique, and is suitable to be a driving component for MEMS micro-actuator.

    Tools

    Get Citation

    Copy Citation Text

    WANG Wei, TIAN Li, LIU Xiao-wei, REN Ming-yuan, ZHANG Ying. PZT piezoelectric function structure on silicon substrate[J]. Optics and Precision Engineering, 2009, 17(3): 583

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 26, 2008

    Accepted: --

    Published Online: Oct. 28, 2009

    The Author Email: Wei WANG (wangweihit@hit.edu.cn)

    DOI:

    CSTR:32186.14.

    Topics