Semiconductor Optoelectronics, Volume. 44, Issue 4, 568(2024)
CMOS Image Sensor Design with Global/Rolling Exposure Compatibility, High Dynamics, and Radiation Resistance
[1] [1] Chen Y, Xu Y, Mierop A J, et al. Column-parallel digital correlated multiple sampling for low-noise CMOS image sensors[J]. IEEE Sens. J., 2011, 12(4): 793-799.
[2] [2] Suh S, Itoh S, Aoyama S, et al. Column-parallel correlated multiple sampling circuits for CMOS image sensors and their noise reduction effects[J]. Sensors, 2010, 10(10): 9139-9154.
[3] [3] Schanz M, Nitta C, Bussmann A, et al. A high-dynamic-range CMOS image sensor for automotive applications[J]. IEEE J. Solid-State Circuits, 2000, 35(7): 932-938.
[4] [4] Furuta M, Kawahito S, Inoue T, et al. A cyclic A/D converter with pixel noise and column-wise offset canceling for CMOS image sensors[C]// Proc. of the 31st ESSCIRC, 2005: 411-414.
[5] [5] Stefanov K D, Dryera B J, Hall D J, et al. A global shutter CMOS image sensor for hyperspectral imaging[J]. Proc. SPIE, 2015, 9602: 96020K.
[6] [6] Qian X, Yu H, Zhao B, et al. Design of a radiation tolerant CMOS image sensor[C]// International Symposium on Integrated Circuits (ISIC), 2011: 412-415.
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LI Ming, LIU Geyang, FU Jing, LIU Changju, NI Piao, JIANG Junxian, REN Siwei. CMOS Image Sensor Design with Global/Rolling Exposure Compatibility, High Dynamics, and Radiation Resistance[J]. Semiconductor Optoelectronics, 2024, 44(4): 568
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Received: Feb. 22, 2024
Accepted: Feb. 13, 2025
Published Online: Feb. 13, 2025
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