Laser & Optoelectronics Progress, Volume. 56, Issue 8, 082301(2019)

Effects of Current and Temperature Stress on Reliability of LED Bulbs

Xuyan Lan, Xin Yang, Shichen Su, and Yong Zhang*
Author Affiliations
  • Institute of Optoelectronic Materials and Technology, South China Normal University, Guangzhou, Guangdong 510631, China
  • show less
    Figures & Tables(10)
    Emission spectrum of LED bulbs and photograph of LED light source module
    Luminous flux maintenance of LED bulbs under different currents at room temperature
    Performances of LED bulbs versus aging time under different currents at room temperature. (a) Chromaticity coordinates; (b) color temperature; (c) color rendering index; (d) emission intensity ratio between yellow phosphor and blue chip
    Aging effects of light source module of LED bulbs under different currents at room temperature. (a) Appearance; (b) infrared thermal imaging; (c) substrate of driving power
    I-V characteristics of chips aged under different currents at room temperature
    Characteristics of LED bulbs under different currents at 55 ℃. (a) Luminous flux maintenance; (b) chromaticity coordinates; (c) color temperature; (d) color rendering index
    Effect of joint temperature-current stress on characteristic of LED bulbs. (a) Emission intensity ratio between yellow phosphor and blue chip; (b) I-V curves of chips and substrate of driving power
    Effect of joint temperature-current stress on characteristics of LED bulbs at 55 ℃ temperature. (a) Aging photographs of light source modules and spectral changes; (b) infrared thermal distributions of light source modules
    • Table 1. Aging lifetimes under different current stresses

      View table

      Table 1. Aging lifetimes under different current stresses

      Temperature /℃Current /mADecay luminescence ratio /%Time /hτLifetime /h
      252508667204599316404
      25300823120158025636
      25350861632111103963
      254508693661892208
    • Table 2. Fitted power exponent n and predicted normal working lifetime of LED device

      View table

      Table 2. Fitted power exponent n and predicted normal working lifetime of LED device

      CurrentI0 /mACurrentIt /mAFittingvalue nLifetime /h
      3003502.297189
      3004502.317217
      3504502.337185
    Tools

    Get Citation

    Copy Citation Text

    Xuyan Lan, Xin Yang, Shichen Su, Yong Zhang. Effects of Current and Temperature Stress on Reliability of LED Bulbs[J]. Laser & Optoelectronics Progress, 2019, 56(8): 082301

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Optical Devices

    Received: Sep. 13, 2018

    Accepted: Nov. 7, 2018

    Published Online: Jul. 26, 2019

    The Author Email: Zhang Yong (zycq@scnu.edu.cn)

    DOI:10.3788/LOP56.082301

    Topics