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Laser & Optoelectronics Progress, Volume. 56, Issue 8, 082301(2019)

Effects of Current and Temperature Stress on Reliability of LED Bulbs

Xuyan Lan, Xin Yang, Shichen Su, and Yong Zhang*
Author Affiliations
  • Institute of Optoelectronic Materials and Technology, South China Normal University, Guangzhou, Guangdong 510631, China
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    Article index updated: Jun. 7, 2024

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    Xuyan Lan, Xin Yang, Shichen Su, Yong Zhang. Effects of Current and Temperature Stress on Reliability of LED Bulbs[J]. Laser & Optoelectronics Progress, 2019, 56(8): 082301

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    Paper Information

    Category: Optical Devices

    Received: Sep. 13, 2018

    Accepted: Nov. 7, 2018

    Published Online: Jul. 26, 2019

    The Author Email: Zhang Yong (zycq@scnu.edu.cn)

    DOI:10.3788/LOP56.082301

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology