Microelectronics, Volume. 54, Issue 2, 304(2024)

Design Processing and Reliability Evaluation of Ceramic Shells under High Temperatures and Pressures

LIU Wenhui1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(3)

    [9] [9] BAKOWSKI M, RANSTAD P. Design and characterization of newly developed 10 kV 2 A SiC p-in diode for soft-switching industrial power supply.IEEE Transactions on Electron Devices [J], 2015, 62(2): 366-373.

    [10] [10] HULL B A, SUMAKERIS J J, O’LOUGHLIN M J,et al. Development of large area (up to 1.5 cm2) 4HSiC 10 kV junction barrier Schottky rectifiers [J].Materials Science Forum. 2008, 600-603: 931-934.

    [11] [11] SUNDARESANA S G, STURDEVANT C,MARRIPELLY M, et al. 12.9 kV SiC PiN diodes with low on-state drops and high carrier lifetimes [J].Materials Science Forum, 2012, 717(2): 949-952.

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    LIU Wenhui. Design Processing and Reliability Evaluation of Ceramic Shells under High Temperatures and Pressures[J]. Microelectronics, 2024, 54(2): 304

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    Paper Information

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    Received: Aug. 24, 2023

    Accepted: --

    Published Online: Aug. 21, 2024

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.230499

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