Acta Optica Sinica, Volume. 44, Issue 3, 0334003(2024)

Simulation of Polarimetric Photoelectric Process in X-Ray Polarization Detector

Renzhou Zheng, Pengfei Qiang*, Lizhi Sheng**, and Yongqing Yan
Author Affiliations
  • State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, Shaanxi , China
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    Renzhou Zheng, Pengfei Qiang, Lizhi Sheng, Yongqing Yan. Simulation of Polarimetric Photoelectric Process in X-Ray Polarization Detector[J]. Acta Optica Sinica, 2024, 44(3): 0334003

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    Paper Information

    Category: X-Ray Optics

    Received: Oct. 9, 2023

    Accepted: Nov. 13, 2023

    Published Online: Feb. 23, 2024

    The Author Email: Qiang Pengfei (qiangpengfei@opt.ac.cn), Sheng Lizhi (lizhi_sheng@opt.ac.cn)

    DOI:10.3788/AOS231631

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