Fig. 1. Schematic diagram of photoelectrons produced by photoelectric effect between photons and matter

Fig. 2. Geant4 simulation model of polarimetric photoelectric process, and particle track simulation results for 2 keV photons entering into 1 cm-thick 90%Ne+10%DME gas mixture. (a) Geant4 simulation model of polarimetric photoelectric process; (b) view 1 of simulation results; (c) view 2 of simulation results; (d) view 3 of simulation results

Fig. 3. Projection of position information of the first "step" of each photoelectron on XY plane for 2 keV photons entering into 1 cm-thick 90%Ne+10%DME gas mixture. (a) Incident photon polarization direction is along X-axis; (b) incident photon polarization direction is along Y-axis

Fig. 4. Projection of position information of the first "step" of each photoelectron on XY plane for photons with different energies entering into 1 cm-thick 90%Ne+10%DME gas mixture (incident photon polarization direction is along X-axis). (a) 2 keV; (b) 3 keV; (c) 4 keV; (d) 5 keV

Fig. 5. Projection of several photoelectron tracks on XY plane for 2 keV photons entering into 1 cm-thick 90%Ne+10%DME gas mixture

Fig. 6. φ distribution of emission photoelectrons for incident photons with different energies (incident photon polarization direction is along X-axis, and number of events in simulation is 10⁴)

Fig. 7. Effect of gas thickness on detection efficiency for 2 keV photons entering into 90%Ne+10%DME gas mixture

Fig. 8. Effect of photon energy on detection efficiency for photons entering into different gas mixtures with thickness of 1 cm

Fig. 9. Effect of photon energy on detection efficiency for photons entering into 1 cm-thick gas mixtures with different ratios. (a) Xe+CO₂; (b) CF₄+C₄H₁₀; (c) Ne+CF₄; (d) Ne+DME; (e) Ar+CO₂; (f) DME+CO₂; (g) Ar+CH₄; (h) He+C₃H₈; (i) effect of gas volume fraction on detection efficiency for 2 keV photons entering into different gas mixtures with thickness of 1 cm