Semiconductor Optoelectronics, Volume. 44, Issue 2, 228(2023)
Research on the Effect of Interface Roughness on Spectral Properties of VUV Optical Thin Film
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HUANG Kai, GUO Chun, KONG Mingdong. Research on the Effect of Interface Roughness on Spectral Properties of VUV Optical Thin Film[J]. Semiconductor Optoelectronics, 2023, 44(2): 228
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Received: Oct. 6, 2021
Accepted: --
Published Online: Aug. 14, 2023
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