Acta Photonica Sinica, Volume. 44, Issue 3, 312001(2015)

Applied Research of Dual-wavelength Shearography for Flaw Detection of Composite Material

GUO Yuan*, MAO Qi, CHENG Xiao-tian, WU Quan, and ZHEN Wei
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    References(18)

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    [2] XIAO Qi-yang, LI Jian, WU Si-jin, YANG Lian-xiang, DONG Ming-li, ZENG Zhou-mo. Measurement of Objects Surface Deformation Using EWT and Kernel Probability Density[J]. Acta Photonica Sinica, 2018, 47(3): 312001

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    GUO Yuan, MAO Qi, CHENG Xiao-tian, WU Quan, ZHEN Wei. Applied Research of Dual-wavelength Shearography for Flaw Detection of Composite Material[J]. Acta Photonica Sinica, 2015, 44(3): 312001

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    Paper Information

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    Received: Jul. 14, 2014

    Accepted: --

    Published Online: Apr. 14, 2015

    The Author Email: Yuan GUO (guoyuan171@126.com)

    DOI:10.3788/gzxb20154403.0312001

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