Acta Photonica Sinica, Volume. 44, Issue 3, 312001(2015)
Applied Research of Dual-wavelength Shearography for Flaw Detection of Composite Material
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GUO Yuan, MAO Qi, CHENG Xiao-tian, WU Quan, ZHEN Wei. Applied Research of Dual-wavelength Shearography for Flaw Detection of Composite Material[J]. Acta Photonica Sinica, 2015, 44(3): 312001
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Received: Jul. 14, 2014
Accepted: --
Published Online: Apr. 14, 2015
The Author Email: Yuan GUO (guoyuan171@126.com)
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