Optical Instruments, Volume. 46, Issue 5, 31(2024)

Design of ATE data storage and transmission system for optical chip testing

Qifan JIA1... Xuanhong JIN1,*, Pengcheng XIAO2 and Hangyu HE1 |Show fewer author(s)
Author Affiliations
  • 1School of Optical-EleCtrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093
  • 2. School of Microelectronics Fudan University, Shanghai 201203, China
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    Figures & Tables(13)
    ATE structure block
    GPMC synchronous burst write timing in address/data multiplexing mode
    Embedded system workflow
    Signal offset in FPGA
    Control signal latch circuit
    Schematic diagram of GPMC interface module
    MIG_controller state diagram
    System implementation and verification platform
    Verify the write function of the system
    Verification of read data and storage function
    Waveform of GPMC writing selection signal
    Waveforms of reading selection with waiting
    • Table 1. System testing results

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      View in Article

      Table 1. System testing results

      突发长度传输次数/次误码率
      4800%
      8400%
      16200%
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    Qifan JIA, Xuanhong JIN, Pengcheng XIAO, Hangyu HE. Design of ATE data storage and transmission system for optical chip testing[J]. Optical Instruments, 2024, 46(5): 31

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    Paper Information

    Category:

    Received: Oct. 26, 2023

    Accepted: --

    Published Online: Jan. 3, 2025

    The Author Email: JIN Xuanhong (judithking@vip.sina.com)

    DOI:10.3969/j.issn.1005-5630.202310260120

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