Optical Instruments, Volume. 46, Issue 5, 31(2024)
Design of ATE data storage and transmission system for optical chip testing
Fig. 2. GPMC synchronous burst write timing in address/data multiplexing mode
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Qifan JIA, Xuanhong JIN, Pengcheng XIAO, Hangyu HE. Design of ATE data storage and transmission system for optical chip testing[J]. Optical Instruments, 2024, 46(5): 31
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Received: Oct. 26, 2023
Accepted: --
Published Online: Jan. 3, 2025
The Author Email: JIN Xuanhong (judithking@vip.sina.com)