Researching | Characterization of Electrical Tapes by Optical Coherence Tomography

Laser & Optoelectronics Progress, Volume. 55, Issue 1, 11101(2018)

Characterization of Electrical Tapes by Optical Coherence Tomography

Liu Kangkang¹, Meng Li¹, Zhang Ning^2,3、*, Sun Zhenwen², Xie Bin³, Liu Xingxing³, and Xu Xiaojing²

Author Affiliations

¹School of Forensic Science, People''s Public Security University of China, Beijing 100038, China

²National Engineering Laboratory for Forensic Science, Institute of Forensic Science, Ministry of Public Security,Beijing 100038, China

³Public Security Bureau of Xingguo County, Ganzhou, Jiangxi 342400, China

show less

Abstract Get PDF(in Chinese)

Figures&Tables (15)

References (16)

Paper Information

Cited By

Article index updated: Nov. 13, 2024

The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Liu Kangkang, Meng Li, Zhang Ning, Sun Zhenwen, Xie Bin, Liu Xingxing, Xu Xiaojing. Characterization of Electrical Tapes by Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2018, 55(1): 11101

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Imaging Systems

Received: Jun. 29, 2017

Accepted: --

Published Online: Sep. 10, 2018

The Author Email: Ning Zhang (zhangning@cifs.gov.cn)

DOI:10.3788/LOP55.011101

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology