Laser & Optoelectronics Progress, Volume. 55, Issue 1, 11101(2018)

Characterization of Electrical Tapes by Optical Coherence Tomography

Liu Kangkang1, Meng Li1, Zhang Ning2,3、*, Sun Zhenwen2, Xie Bin3, Liu Xingxing3, and Xu Xiaojing2
Author Affiliations
  • 1School of Forensic Science, People''s Public Security University of China, Beijing 100038, China
  • 2National Engineering Laboratory for Forensic Science, Institute of Forensic Science, Ministry of Public Security,Beijing 100038, China
  • 3Public Security Bureau of Xingguo County, Ganzhou, Jiangxi 342400, China
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    Optical coherence tomography (OCT) is a non-destructive, high-resolution,and fast tomographic imaging technique. Electrical tape is an important physical evidence in the forensic science. A self-built frequency-domain OCT system is employed to obtain two-dimensional (2D) cross-sectional OCT images of electrical tapes from ten different brands. The optical path, the scattering intensity ratio, the number of signal peaks, and the attenuation coefficient are extracted from the 2D cross-sectional OCT images of electrical tapes. Statistically significant differences of the parameters are compared in those different samples. Meanwhile, three-dimensional (3D) OCT image reconstruction of the electrical tapes is also implemented to create transverse sectional images beneath the surface. The experiments demonstrate that OCT provides a series of new features to effectively distinguish different brands of electrical tapes. OCT provides in-situ, non-destructive, high-resolution, and easily operated real-time examination, and it is a promising method for electrical tape examination in the forensic science.

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    Liu Kangkang, Meng Li, Zhang Ning, Sun Zhenwen, Xie Bin, Liu Xingxing, Xu Xiaojing. Characterization of Electrical Tapes by Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2018, 55(1): 11101

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    Paper Information

    Category: Imaging Systems

    Received: Jun. 29, 2017

    Accepted: --

    Published Online: Sep. 10, 2018

    The Author Email: Ning Zhang (zhangning@cifs.gov.cn)

    DOI:10.3788/LOP55.011101

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