Journal of Applied Optics, Volume. 43, Issue 6, 1130(2022)

Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier

Jie LU1... Le CHANG2,*, Yixin CHEN3, Yunlong JIANG2, Tianning SU2, Beihong LIU2, Hang ZHAO2, Yunsheng QIAN1 and Jian LIU1 |Show fewer author(s)
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2North Night Vision Technology Co.,Ltd., Kunming 650217, China
  • 3Nanjing Magewell Electronics Co.,Ltd., Nanjing 210094, China
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    References(5)

    [2] [2] BAI Yanzhu, JIN Weiqi. Principle and technology of photoelectric imaging[M]. Beijing: Beijing Institute of Technology Press, 2013: 245-251.

    [8] [8] SHI Zuowei. Study on parameters test technology of fluorescent screen of low-light image intensifier [D]. Nanjing: Nanjing University of Science and Technology, 2008..

    [9] [9] SUN Xianan. Research on luminance gain and afterglow test technology of low-light image intensifier [D]. Nanjing: Nanjing University of Science and Technology, 2012.

    [11] [11] QIU Yafeng. Luminescence characteristics and test technology of low-light image intensifier fluorescent screen[D]. Nan jing: Nanjing University of Science and Technology, 2008.

    [15] [15] General Armament Department of Chinese People′s Liberation Army. General specification for super second generation image intensifier assembly: GJB 7351-2011 [S]. Beijing: China Standard Press, 2011.

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    Jie LU, Le CHANG, Yixin CHEN, Yunlong JIANG, Tianning SU, Beihong LIU, Hang ZHAO, Yunsheng QIAN, Jian LIU. Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1130

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    Paper Information

    Category: Research Articles

    Received: Aug. 15, 2022

    Accepted: --

    Published Online: Nov. 18, 2022

    The Author Email:

    DOI:10.5768/JAO202243.0604012

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