Journal of Applied Optics, Volume. 43, Issue 6, 1130(2022)
Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier
[2] [2] BAI Yanzhu, JIN Weiqi. Principle and technology of photoelectric imaging[M]. Beijing: Beijing Institute of Technology Press, 2013: 245-251.
[8] [8] SHI Zuowei. Study on parameters test technology of fluorescent screen of low-light image intensifier [D]. Nanjing: Nanjing University of Science and Technology, 2008..
[9] [9] SUN Xianan. Research on luminance gain and afterglow test technology of low-light image intensifier [D]. Nanjing: Nanjing University of Science and Technology, 2012.
[11] [11] QIU Yafeng. Luminescence characteristics and test technology of low-light image intensifier fluorescent screen[D]. Nan jing: Nanjing University of Science and Technology, 2008.
[15] [15] General Armament Department of Chinese People′s Liberation Army. General specification for super second generation image intensifier assembly: GJB 7351-2011 [S]. Beijing: China Standard Press, 2011.
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Jie LU, Le CHANG, Yixin CHEN, Yunlong JIANG, Tianning SU, Beihong LIU, Hang ZHAO, Yunsheng QIAN, Jian LIU. Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1130
Category: Research Articles
Received: Aug. 15, 2022
Accepted: --
Published Online: Nov. 18, 2022
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