Journal of Applied Optics, Volume. 43, Issue 6, 1130(2022)

Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier

Jie LU1... Le CHANG2,*, Yixin CHEN3, Yunlong JIANG2, Tianning SU2, Beihong LIU2, Hang ZHAO2, Yunsheng QIAN1 and Jian LIU1 |Show fewer author(s)
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2North Night Vision Technology Co.,Ltd., Kunming 650217, China
  • 3Nanjing Magewell Electronics Co.,Ltd., Nanjing 210094, China
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    Figures & Tables(16)
    Structure block diagram of rapid afterglow time test system for fluorescent screen
    Physical drawing of rapid afterglow time test system for fluorescent screen
    Physical drawing of rapid afterglow time inner structure of camera obscura
    Structure block diagram of luminance test module
    Hardware physical drawing of luminance test module
    Program interface of rapid afterglow time test system for fluorescent screen
    Iteration diagram of Kalman filtering algorithm
    Schematic diagram of Kalman filter with different parameter values
    Flow chart of fast finding jump edge algorithm based on downsampling
    Afterglow curve of light source under empty-tube conditions
    Schematic diagram of afterglow curve of fluorescent screen
    Schematic diagram of luminance curves of fluorescent screen under different gain voltages
    Schematic diagram of luminance curves of fluorescent screen under different light source intensities
    • Table 1. Signal parameter setting of high-speed signal generator

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      Table 1. Signal parameter setting of high-speed signal generator

      脉冲方波参数脉冲方波指标
      周期/µs10
      振幅/V1.70~1.80
      频率/kHz100
      占空比/%50~90
      上升时间/ns2
      下降时间/ns2
    • Table 2. Test results of light source afterglow under empty-tube conditions

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      Table 2. Test results of light source afterglow under empty-tube conditions

      次数余辉时间/ns次数余辉时间/ns
      112.64611.53
      211.82711.48
      312.46812.20
      410.85910.98
      511.061011.54
      平均值/ns11.656
    • Table 3. Afterglow test results in single mode

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      Table 3. Afterglow test results in single mode

      次数余辉时间/ns次数余辉时间/ns
      1118.49336116.2533
      2118.21337117.4400
      3113.36008117.5839
      4122.08009119.9867
      5120.733310116.8000
      平均值/ns118. 0944
      重复度/%2.08
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    Jie LU, Le CHANG, Yixin CHEN, Yunlong JIANG, Tianning SU, Beihong LIU, Hang ZHAO, Yunsheng QIAN, Jian LIU. Development of afterglow time test system for nanosecond fluorescent screen of low-level-light image intensifier[J]. Journal of Applied Optics, 2022, 43(6): 1130

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    Paper Information

    Category: Research Articles

    Received: Aug. 15, 2022

    Accepted: --

    Published Online: Nov. 18, 2022

    The Author Email:

    DOI:10.5768/JAO202243.0604012

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