Acta Photonica Sinica, Volume. 52, Issue 11, 1112001(2023)

Ellipsometric Measurement of the Refractive Index of Monocrystalline Silicon in a Diamond Anvil Cell

Xiaoyan BAO... Shuo DENG, Haifei LV and Min LI* |Show fewer author(s)
Author Affiliations
  • School of Science,Wuhan University of Technology,Wuhan 430070,China
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    Xiaoyan BAO, Shuo DENG, Haifei LV, Min LI. Ellipsometric Measurement of the Refractive Index of Monocrystalline Silicon in a Diamond Anvil Cell[J]. Acta Photonica Sinica, 2023, 52(11): 1112001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: May. 6, 2023

    Accepted: Jun. 25, 2023

    Published Online: Dec. 22, 2023

    The Author Email: LI Min (minli@whut.edu.cn)

    DOI:10.3788/gzxb20235211.1112001

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