Acta Photonica Sinica, Volume. 52, Issue 11, 1112001(2023)
Ellipsometric Measurement of the Refractive Index of Monocrystalline Silicon in a Diamond Anvil Cell
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Xiaoyan BAO, Shuo DENG, Haifei LV, Min LI. Ellipsometric Measurement of the Refractive Index of Monocrystalline Silicon in a Diamond Anvil Cell[J]. Acta Photonica Sinica, 2023, 52(11): 1112001
Category: Instrumentation, Measurement and Metrology
Received: May. 6, 2023
Accepted: Jun. 25, 2023
Published Online: Dec. 22, 2023
The Author Email: LI Min (minli@whut.edu.cn)